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INTERACTION OF ELECTRONS WITH SOLIDS
CONVENTIONAL TRANSMISSION ELECTRON MICROSCOPY
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accelerating voltage amplitude applications atomic number back focal plane back scattered Bloch wave Bragg angle Bragg reflection cathodoluminescence Chapter chromatic aberration coherence contrast conventional transmission crystalline CTEM dark field defects detail detector diffraction pattern disc discussed dislocations displacement distance effects electric electron beam electron diffraction electron optical emissive mode energy analysis energy loss excitation factor Figure film final lens fringes function given high voltage incident beam incident electron increased inelastic scattering instrument lattice planes lenses magnetic magnification materials science matrix micrograph microscope objective aperture objective lens observed obtained p-n junction particles phase potential precipitate probe produced raster reciprocal lattice replica resolving power result scanning electron scanning electron microscopy scanning microscopy scattered electrons schematic secondary electrons shown in Fig signal single crystal specimen surface spherical aberration spot stacking fault STEM structure techniques thickness thin transmission electron microscopy vector wave wavelength Wien filter X-ray