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SERIES INTRODUCTION Brian J Thompson
ELECTRON EMISSION AND EMISSION AND IONIZATION MICROSCOPY
ELECTRON AND ION OPTICS AND OPTICAL SYSTEMS
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aberration accelerating potential alloy amplitude analysis angle aperture applications atoms Auger electron axis backscattered Bragg Bragg angle Burgers vector Chap corresponding crystal crystallographic dark-field image detection detector diamond cubic diffraction spot dislocation effect elec electron beam electron diffraction pattern electron emission electron optical elements emitter evaporation field field-ion foil fringes function geometry grain boundaries intensity ion beam ionization Kikuchi L. E. Murr layer lens magnetic materials metal microanalysis microprobe mode object objective lens observed occur orientation Phys plane probe reciprocal lattice reflection replica resolution result rotation scanning electron microscope scattering schematically secondary electron secondary emission selected-area electron diffraction shown in Fig signal solid specific specimen surface stacking fault stainless steel structure techniques thermionic emission thickness thin films tion transmission electron microscopy tron twin twin spots unit cell vector voltage wave wavelength zone