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acceleration potential alloy Analytical Chemistry Andersen Applied Physics Auger electron Auger Electron Spectroscopy backscattered beam current beam diameter Beaman C(DL calculated Castaing cathodoluminescence chemical composition computer program concentration Cosslett count rate crystal detectability limit diffraction dispersive spectrometer Duncumb effects electron beam Electron Microprobe Electron Microscope Electron Probe Analysis Electron Probe Microanalysis element emission emitted energy dispersive EPASA error excitation experimental fluorescence correction function Heinrich Henoc instrument intensity ratio Ion Microprobe ionization Journal of Applied Laboratory lens Mass Analyzer material measured ment Micro Microprobe Analysis Ogilvie optical P/B ratio Paper peak percent Philibert problem Proportional Counter proportional detector quantitative analysis radiation range Reed resolution Russ Scanning Electron Scanning Electron Microscope scattering sensitivity solid angle Solosky specimen spectral standard surface take-off angle target techniques thin films tion values wavelength X-radiation X-ray intensity X-ray line Yakowitz