Electron holography: proceedings of the International Workshop on Electron Holography, Holiday Inn World's Fair, Knoxville, Tennessee, USA, August 29-31, 1994
Electron holography is a very powerful technique which uses the phase information in the electron image to study fundamental physics of matter at the micrometer to nanometer scale, or even to Aring;ngstrom scale. A few years ago, successful examples of electron holography included confirmation of Aharonov-Bohm (AB) effect and direct visualization of magnetic fields not only outside but also inside of magnetic materials. Since then, fields of application of electron holography have expanded from solid state physics to materials science and the biological sciences, and new techniques have been invented including real-time holography and computed tomography of the reconstructed phase image. Containing contributions from electron holography experts, this book is therefore a unique review of recent developments and future prospects, presented by the innovators in this field.The chapters cover a wide area of application fields and new techniques; magnetic fluxes (vortices) in superconductors, magnetic domains, magnetic and electric microfields, and p-n junctions, catalysts, biological filaments, fine particles, and fullerenes for materials applications. Chapters are also included on digital recording and processing, real-time electron holography, computed tomography and STEM holography.
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INTRODUCTION TO ELECTRON HOLOGRAPHY
State and experimental steps towards 0 1
HOLOGRAPHIC INTERFERENCE ELECTRON MICROSCOPY
26 other sections not shown
1995 Elsevier Science amplitude and phase aperture applied atomic axis beam tilt carbon carbon nanotubes coherence columns contrast correction crystal D.C. Joy D.J. Smith defocus diffraction domain walls electron beam electron biprism electron hologram electron holography electron microscope electron wave Elsevier Science B.V. equation field emission Figure filament film flux lines Fourier transform Fresnel fringes fringe spacing fullerene high resolution Hitachi illumination image plane image wave intensity interference fringes interference micrograph interferometry Joy and Y.A. JRDC L.F. Allard lattice LC-panel Lett Lichte magnetic field magnetic flux magnification method nanotubes object wave objective lens observed obtained optical p-n junction particles phase difference phase distribution phase shift Phys pixels Pozzi processing reconstructed image recorded reference wave Saitama sample shown in Fig shows sideband simulated specimen spherical aberration structure superconductor Tanji technique thickness thin tilted Ultramicroscopy USA Phone voltage vortex vortices wave function Y.A. Ono Editors