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Towards Microscopy 2000 Invited
the OnGoing Technological Challenge Invited
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aberration accelerating voltage alloy amorphous amplitude analysis angle aperture application astigmatism atomic Bloch wave calculated carbon cell coefficient contrast crystal deconvolution defocus detection detector determined diameter diffraction pattern dislocations distribution edge EELS electron beam electron crystallography electron diffraction electron holography Electron Microscopy elements energy loss experimental Fig.l Figure film filter Fourier function grain boundary high resolution hologram holography HREM images HRTEM intensity interface INTRODUCTION July lattice layer magnetic magnification material Materials Science measured method micrographs Microsc microscope mode objective lens observed obtained orientation oxide parameters particles peak phase Phys pixel plane plasmon potential probe Proc quantitative ratio reconstruction region sample scanning electron microscope scattering secondary electron shown shows signal simulated specimen spectra spectrum spherical aberration structure factors surface technique temperature thickness thin tilt transmission electron transmission electron microscope Ultramicroscopy voltage wave X-ray