Electron microscopy, 1998: proceedings of the 14th International Congress on Electron Microscopy, Cancún (Mexico), 31 August to 4 September 1998, Volume 3
Héctor A. Calderón Benavides, M. José Yacamán
Institute of Physics Pub., 1998 - Science
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Refinement of amorphous and polycrystalline structures of thin disordered films using
Structural studies of decagonal quasicrystals using the highangle annular darkfield
a convergent beam electron
8 other sections not shown
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Electron Microscopy 1998: Proceedings of the 14th International Congress on ...
Miguel Jose Yacaman
No preview available - 1998
1998 Symposium DD 31 August alloy amorphous analysis angle annealing atomic axis calculated Cancun carbon nanotubes cell characterization chemical clusters composition compounds contrast corresponding crystal crystalline crystallites defects density deposition diameter dislocations edge electron beam electron diffraction electron diffraction pattern energy loss epitaxial experimental Figure films formation fullerenes GaAs grain boundary graphite growth high resolution HREM image HRTEM ICEMI4 implants in-situ InGaAs intensity interface irradiation Japan JEOL lattice layer Lett matrix Maya Blue mechanical metal method Mexico microanalysis micrograph microstructure nanostructures observed obtained oxide palygorskite Paper presented parameters particles peak phase Phys planes presented at ICEM14 properties quantum dots quasicrystal References region sample scanning electron scanning electron microscopy semiconductor September 1998 Symposium shown in Fig shows silicon simulated smectite solid specimen spectroscopy spectrum structure substrate surface techniques temperature thickness thin transmission electron microscopy tube Volume X-ray