Electron microscopy and analysis, 1981: proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held at the University of Cambridge, 7-10 September 1981 (EMAG 81)
Institute of Physics, 1982 - Science - 563 pages
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invited E Zeitler
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Electron Microscopy and Analysis 1999: Proceedings of the Institute of ...
C. J. Kiely
Limited preview - 1999
7-10 September aberration alloy amorphous analysis angle annealing aperture atomic number axis Bloch waves Burgers vector calculated Cambridge carbon cathodoluminescence Cavendish Laboratory composition contrast coronene corresponding crystal dark field defocus density detection detector diameter diffraction pattern dislocations distribution EBIC edge effect electron beam electron diffraction Electron Microscopy emission energy loss excitation experimental Fig.l Figure fringes grain boundary graphite high resolution HREM incident intensity interface lattice images layer martensite material measured metal microanalysis micrograph microscope mode objective lens observed obtained optical orientation oxide Paper presented parameters particles peak phase Phys plane plasmon precipitates presented at EMAG probe Proc range ratio region sample scanning scattering September 1981 shown in Fig shows signal spatial resolution specimen spectra spectrometer spectrum STEM structure surface technique temperature thin film tilt transmission electron microscopy tremolite twin unit cell University of Cambridge voltage X-ray