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aluminium amplitude angle aperture approximation astigmatism atoms axis Bloch waves Boersch Bragg Bragg planes bright field Burgers vector calculated chromatic aberration clusters copper corresponding Courtesy crystal current density curve dark field defects defocus detector device diffraction pattern dislocation displacement distance distribution domain wall double tilting effect elastic electron microscopy electrostatic energy loss equation experimental field emission field image foil frequency fringes geometrical given high resolution Howie inelastic scattering integration intensity interstitial irradiation Journ lattice lenses loops magnification matrix measured metal micrographs microscope objective lens observed obtained optical particles phase contrast phase shift Phil phonon Phys plate potential prism Problem Proc produced region rotation sample scanning secondary ion semiconductor detector shown in Fig shows signal specimen spherical aberration stacking fault stages stigmatic structure surface symmetrical technique temperature thickness tion trajectories transfer vacancies Valdre vector voltage wave function wave vector width zero