Electron Microscopy in Materials Science: Third Course of the International School of Electron Microscopy, "Ettore Majorana" International Centre for Scientific Culture, Parts 1-2
Commission of the European Communities, 1975 - Electron microscopes
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Instrument operation for microscopy
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absorption alignment angle atoms axis Bloch wave Bragg angle bright field image Brillouin zone Burgers vector BW contrast figures calculated chromatic chromatic aberration Cockayne components contour diagrams courtesy dark field image defects determined deviation parameter diameter diffracted beam diffraction pattern direction dispersion surface effect eigenvalue equation electron diffraction Electron Microscopy Ewald sphere exact Bragg position experimental foil fringes given high energy Howie intensity kinematical Laue magnification matrix Metherell method micrographs microscope n-beam normal objective aperture objective lens observed obtained orientation perfect crystal phase Phil.Mag plane wave pole piece system polishing problem profiles reciprocal lattice points reciprocal lattice vectors resolution shown in Fig solution spacing specimen spherical aberration stacking fault stacking fault energy Stobbs strain field symmetric theory thickness thin tilt tion transmission electron microscopy Valdre values voltage wave amplitudes wave function wave points wave vectors waves excited weak beam technique zone boundary