Electron Microscopy in Solid State Physics
Heinz Bethge, Johannes Heydenreich
Elsevier, 1987 - Science - 596 pages
In almost all fields of research of science, engineering and medicine, electron microscopy as a method of directly imaging submicroscopic structures has become increasingly important. This book reports on the capabilities and limitations of the application of electron microscopy to solid state physics and materials science. The book is divided into two parts. In the first part, the methods of electron microscope examination employed in solid state physics are described, with special reference to the reliable interpretation of electron micrographs. The second part of the book deals with applications and covers those fields of solid state physics and materials science to which electron microscopy may appreciably contribute. The book is intended as a review for a wide circle of readers including solid state physicists and materials scientists. Those already familiar with electron microscopy will appreciate the up-to-date information on the latest methods and applications. Those who are not so familiar with electron microscopy will find the book to be a valuable introduction to the various fields of application, illustrated by a wealth of specially chosen examples.
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Fundamentals of electron optics
Electron Diffraction Fundamentals and Application
21 other sections not shown
aberration amplitude analysis angle aperture appl applied approximation atomic backscattered Bloch waves bright-field Burgers vector calculated cathode Chapter cleavage Conf Congr crack crystal defects Crystal Growth decoration deformation density deposit detector determined diameter diffraction contrast diffraction pattern diffusion dislocations distance electron beam electron diffraction emission epitaxial evaporation excitation experimental ferroelectric field fracture fringe function grain boundaries high resolution HREM hydrogen image contrast image processing intensity interaction interface Internat investigations lattice layer London magnetic metals methods Micr micrographs Microsc º º objective lens observed optical Optik orientation p-n junction parameters particles phase Phil Phys plane polymers potential precipitates primary electron Proc reciprocal lattice regions RHEED Scanning Electron Microscopy scattering semiconductor shown in Fig silicon Solid specimen surface spherical aberration stacking faults stat steps stress substrate technique temperature theory thickness thin film Transmission Electron Microscopy Ultramicroscopy wave yield