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THE ELECTRON MICROSCOPE
CONVENTIONAL TRANSMISSION ELECTRON MICROSCOPY
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aberration accelerating voltage amplitude applications atomic number back focal plane back scattered Bloch wave Bragg angle bright cathodoluminescence Chapter chromatic aberration coherence contrast conventional transmission crystalline CTEM dark ﬁeld defects deﬁned detail diffraction pattern discussed dislocation displacement effects electric ﬁeld electron beam electron diffraction electron gun electron optical emissive mode energy analysis energy loss excitation factor ﬁbres ﬁeld Figure ﬁlament ﬁlm ﬁnal ﬁrst fringes function high voltage incident beam incident electron increased instrument intensity lattice planes lenses magnetic magniﬁcation materials science micrograph microscope objective aperture objective lens observed obtained particles pattem phase potential precipitate probe raster reciprocal lattice reﬂection reﬂective mode replica result scanning electron microscopy scattered electrons schematic secondary electrons shown in Fig signal speciﬁc spherical aberration spot STEM structure sufﬁcient techniques thickness thin transmission electron microscopy vector wave wavelength X-ray