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Electron Microscopy at Atomic Resolution
Computer Interfaced Electron Microscope
Image Processing for Electron Microscope Investigations
24 other sections not shown
A.H. Heuer Acta alloy amorphous analysis angle annealing aperture Appl atoms axis basal bright field Burgers vectors calculated ceramics chalcocite composition contrast crystalline crystallites dark field defects deposition diffraction pattern diffusion dislocations dissociation dopant electron beam electron diffraction energy epitaxial equilibrium experimental field image Figure formation frame store fringes GaAs grain boundary growth high resolution indicated InGaAsP InGaP intensity interface lattice lattice image layer material matrix metal micrographs microscope misfit objective lens observed obtained optical orientation oxide oxygen p-n junction parameters particles phase Phys plane precipitates Proc reaction reconstruction reflections region RHEED sample scanning scattering Science Publishing semiconductors shown in Fig shows silicon single crystal specimen position spinel spots stacking fault STEM structure substrate superlattice surface reconstruction Symp technique temperature thickness tilt tion transformation transmission electron microscopy twin boundary Ultramicroscopy vacancy voltage x-ray