Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability

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Mohammad H. Tehranipoor
Springer Science & Business Media, Dec 8, 2007 - Technology & Engineering - 408 pages
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Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

 

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Contents

Cellular ArrayBased DelayInsensitive
203
QCA Circuits for Robust Coplanar Crossing
227
u and C S Lent 251
250
Testing Microfluidic Biochips
264
S Ozev and K Chakrabarty 267
286
Reliability for Nanotechnology Devices
313
Towards Nanoelectronics Processor Architectures
339
Design and Analysis
373

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