EUREM 88: Proceedings of the 9th European Congress on Electron Microscopy Held in York, England, 4-9 September 1988, Volume 1Peter J. Goodhew, H. G. Dickinson |
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Common terms and phrases
aberrations analysis angle aperture applied astigmatism atomic Auger electrons Auger peak backscattered backscattered electrons beam tilt bright field calculated camera cell colloidal gold cooling cryofixation cryoprotectants deflection defocus density described detection detector diffraction group diffractogram disc distribution electron beam electron diffraction electron optical emission England EUREM 88 experimental Figure film filter Fourier fringes function high resolution hologram HREM image processing inelastic instrument intensity interface ion beam laser lattice lectin LEEM magnification material measured mesh method micrographs Microsc mode noise objective lens obtained Paper presented particles phase contrast Phys pixels plane point group Proc pulse recording reference Reimer sample Scanning Electron Microscopy scintillator secondary electron sections shows signal single crystal spatial specimen spectra spectrometer spectrum step Straße des 17 structure surface symmetry technique Telieps temperature thickness thin tilt tissue transmission electron microscope Ultramicroscopy voltage X-ray York zone axis