## Exploring scanning probe microscopy with MathematicaThis book/software edition provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. Its self-contained presentation spares researchers the valuable time spent hunting through the technical literature in search of prior theoretical results required to understand the models presented. Mathematica code for all examples is included both in the book and at the accompanying ftp site, affording the freedom to change, at will, the values and parameters of specific problems or even modify the programs themselves to suit various modeling needs. Exploring Scanning Probe Microscopy with Mathematica is both a solid professional reference and an advanced-level text, beginning with scanning probe microscopy basics and moving on to cutting-edge techniques, experiments, and theory. In the section devoted to atomic force microscopy, Dr. Sarid describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features chapters covering density of states in arbitrary dimensions, quantum wells and dots, and electrostatics. |

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### Contents

INTRODUCTION | 1 |

UNIFORM CANTILEVERS | 7 |

CANTILEVER CONVERSION TABLES | 23 |

Copyright | |

13 other sections not shown

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### Common terms and phrases

adhesion amplitude of vibration analytical solution angular spring constants aperture approximate solution atomic force microscope atto average barrier height AxesOrigin bias bimorph calculate capacitance casel characteristic functions Circular Cantilever Clear contact force contact radius cycle dashed line DefaultFont->{"Times-Roman",8 denoted density displacement DisplayFunction->Identity electric field electron energy levels equation of motion Evaluate[opt Figure finite force derivative FrameLabel graphical representation hysteresis loop image potential indentation force Lennard-Jones force Lennard-Jones potential logarithmic derivative magnetic dipole micro nano nano]/nano Note numerical value obtained oxide parameters phase of vibration plane plot Plot[Evaluate PlotRange point-charge potentialGraphics Poynting vector quantum dot quantum wire radius of contact rectangular cantilevers replacement rule resonance frequency respectively Rtip run the code scanning probe microscopy scanning tunneling microscopy shown in Fig snap-in solid line sphere stest surface tbll tip and sample tip-sample distance tip-sample force tunneling current V-shaped cantilever vector voltage width