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A MODEL FOR FLUX PINNING BY THIN PLANAR DEFECTS
SPECIMENT FABRICATION MEASUREMENT AND CHARACTERIZATION
7 other sections not shown
aging Ak/k alloy alpha phase Fb-Bi Angstroms anisotropy antiferromagnetic atoms behavior boundary acting calculated Chapter coherence length cold finger composition profile Cooper pairs Cr layer critical field curve defect plane density dependence deposited dewar DGBM diffusion diffusion pump double-layer film driving force effect elastic electron scattering elementary pinning force evaporation Evetts experimental Fb coated films Fb-Bi field orientation Figure film thickness flux pinning fluxoid FORMATdH Fourier transform function grain boundary pinning grain size high field impurity interdiffusion interface layer spacing magnetic field material mean free path normal observed order parameter peak pinning centers pinning model pinning plane pinning strength planar defects plotted position pre-age predicted proximity effect reduced field replica roughly shown in Fig shutter specimens substrate summation superconducting surface pinning temperature Tesla thin tilt uncoated twin vacuum values vectors voltage width