Handbook of Microscopy, Handbook of Microscopy: Applications in Materials Science, Solid-State Physics, and Chemistry. Methods II
S. Amelinckx, Dirk van Dyck, J. van Landuyt, Gustaaf van Tendeloo
Wiley, Dec 27, 1996 - Science - 507 pages
Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information.
With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which techique is suitable for characterizing a given material?"
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Nuclear Magnetic Resonance
Scanning Electron Microscopy with Polarization Analysis
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analysis analyzer angle aperture atom probe Auger electrons backscattered barrier height beam current BEEM cantilever chemical coherent components contrast crystal CTEM deflection density dependence detection detector diameter diffraction effects elec electron beam electron microscopy element emission emitted field ion microscopy Figure film force Fourier frequency fringes function gradient incident beam inelastic intensity interface ionization J. M. Cowley lateral resolution layer Lett magnetic field magnification mass mass spectrometer material measured metal method micro Microsc mode objective lens obtained optical particles photocathode photoelectron photon Phvs Phys pixel plane polarization potential primary pulse quantum region sample surface scanning electron scanning tunneling microscopy scattering Schottky barrier secondary electrons secondary ions semiconductor SEMPA shown in Fig signal silicon spatial resolution specimen spectra spectrometer spectroscopy spin structure substrate technique thickness tion transmission electron transmission electron microscopy trons Ultramicroscopy voltage X-ray