Hardware and Software: Verification and Testing: 4th International Haifa Verification Conference, HVC 2008, Haifa, Israel, October 27-30, 2008, Revised Selected Papers

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Hana Chockler, Alan J. Hu
Springer Science & Business Media, Apr 22, 2009 - Computers - 215 pages
These are the conference proceedings of the 4th Haifa Veri?cation Conference, held October 27–30, 2008 in Haifa, Israel. This international conference is a unique venue that brings together leading researchers and practitioners of both formal and dynamic veri?cation, for both hardware and software systems. This year’s conference extended the successes of the previous years, with a largejumpinthenumberofsubmitted papers. Wereceived49totalsubmissions, with many more high-quality papers than we had room to accept. Submissions came from 19 di?erent countries, re?ecting the growing international visibility of the conference. Of the 49 submissions, 43 were regular papers, 2 of which were later withdrawn, and 6 were tool papers. After a rigorous review process, in which each paper received at least four independent reviews from the dist- guished Program Committee, we accepted 12 regular papers and 4 tools papers for presentation at the conference and inclusion in this volume. These numbers give acceptance rates of 29% for regular papers and 67% for tool papers (34% combined) — comparable to the elite, much older, conferences in the ?eld. A Best Paper Award, selected on the basis of the reviews and scores from the Program Committee, was presented to Edmund Clarke, Alexandre Donz ́ e, and AxelLegayfortheirpaperentitled“StatisticalModelCheckingofMixed-Analog Circuits with an Application to a Third-Order Delta-Sigma Modulator. ” The refereed program was complemented by an outstanding program of - vited talks, panels, and special sessions from prominent leaders in the ?eld.
 

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Contents

Hazards of Verification
1
AutomataTheoretic Model Checking Revisited
2
Proofs Interpolants and Relevance Heuristics HVC 2008 Award Winner
3
Is Verification Getting Too Complex?
4
Can Mutation Analysis Help Fix Our Broken Coverage Metrics?
5
Practical Considerations Concerning HLto RT Equivalence Checking
6
A Framework for Inherent Vacuity
7
A Meta Heuristic for Effectively Detecting Concurrency Errors
23
Iterative Delta Debugging
99
LinearTime Reductions of Resolution Proofs
114
Significant Diagnostic Counterexamples in Probabilistic Model Checking
129
Statistical Model Checking of MixedAnalog Circuits with an Application to a Third Order Δ Σ Modulator
149
Structural Contradictions
164
Synthesizing Test Models from Test Cases
179
Parallelizing SMTBased BMC Using Tunnels over a Distributed Framework
194
Progress in Automated Software Defect Prediction
200

A Uniform Approach to ThreeValued Semantics for μCalculus on Abstractions of Hybrid Automata
38
Automatic Boosting of CrossProduct Coverage Using Bayesian Networks
53
Efficient Decision Procedure for Bounded Integer Nonlinear Operations Using SMTLIA
68
Evaluating Workloads Using Comparative Functional Coverage
84
SeeCode A Code Review Plugin for Eclipse
205
Automatically Configuring Algorithms with RuleBasePE
210
Author Index
215
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