Hardware and Software: Verification and Testing: 4th International Haifa Verification Conference, HVC 2008, Haifa, Israel, October 27-30, 2008, Revised Selected Papers
Hana Chockler, Alan J. Hu
Springer Science & Business Media, Apr 22, 2009 - Computers - 215 pages
These are the conference proceedings of the 4th Haifa Veri?cation Conference, held October 27–30, 2008 in Haifa, Israel. This international conference is a unique venue that brings together leading researchers and practitioners of both formal and dynamic veri?cation, for both hardware and software systems. This year’s conference extended the successes of the previous years, with a largejumpinthenumberofsubmitted papers. Wereceived49totalsubmissions, with many more high-quality papers than we had room to accept. Submissions came from 19 di?erent countries, re?ecting the growing international visibility of the conference. Of the 49 submissions, 43 were regular papers, 2 of which were later withdrawn, and 6 were tool papers. After a rigorous review process, in which each paper received at least four independent reviews from the dist- guished Program Committee, we accepted 12 regular papers and 4 tools papers for presentation at the conference and inclusion in this volume. These numbers give acceptance rates of 29% for regular papers and 67% for tool papers (34% combined) — comparable to the elite, much older, conferences in the ?eld. A Best Paper Award, selected on the basis of the reviews and scores from the Program Committee, was presented to Edmund Clarke, Alexandre Donz ́ e, and AxelLegayfortheirpaperentitled“StatisticalModelCheckingofMixed-Analog Circuits with an Application to a Third-Order Delta-Sigma Modulator. ” The refereed program was complemented by an outstanding program of - vited talks, panels, and special sessions from prominent leaders in the ?eld.
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Hazards of Verification
AutomataTheoretic Model Checking Revisited
Proofs Interpolants and Relevance Heuristics HVC 2008 Award Winner
Is Verification Getting Too Complex?
Can Mutation Analysis Help Fix Our Broken Coverage Metrics?
Practical Considerations Concerning HLto RT Equivalence Checking
A Framework for Inherent Vacuity
A Meta Heuristic for Effectively Detecting Concurrency Errors
Iterative Delta Debugging
LinearTime Reductions of Resolution Proofs
Significant Diagnostic Counterexamples in Probabilistic Model Checking
Statistical Model Checking of MixedAnalog Circuits with an Application to a Third Order Δ Σ Modulator
Synthesizing Test Models from Test Cases
Parallelizing SMTBased BMC Using Tunnels over a Distributed Framework
Progress in Automated Software Defect Prediction
A Uniform Approach to ThreeValued Semantics for μCalculus on Abstractions of Hybrid Automata
Automatic Boosting of CrossProduct Coverage Using Bayesian Networks
Efficient Decision Procedure for Bounded Integer Nonlinear Operations Using SMTLIA
Evaluating Workloads Using Comparative Functional Coverage
SeeCode A Code Review Plugin for Eclipse
Automatically Conﬁguring Algorithms with RuleBasePE
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A.J. Hu Eds abstractions algorithm analysis approach atomic propositions automated automaton Bayesiannetworks Berlin Heidelberg 2009 bisimulation BMC instance Boolean bounding constraints change set Chockler and A.J. Computer counterexamples decision procedure defect deﬁned deﬁnition delta debugging denote eﬀectiveness encoding equivalent example execution ﬁles ﬁnal ﬁnd finite ﬁnite paths ﬁrst functional coverage Haifa Heidelberg heuristic hybrid automata IBM Haifa Research IEEE inherent vacuity inherently vacuous integer iterations Kripke structure LBR-LL linear linear temporal logic LNCS LTL formula Markov Markov chains MessageOnItsWay meta heuristic model checking model-based testing module mutation n.piv nodes OpenMessaging partition patch probabilistic problem Proc properties PSPACE reachability SAT solver satisﬁes SeeCode semantics SERE signal SMT(LIA speciﬁcation Springer strongly connected components structural contradictions subformula subset technique Theorem tool truncated semantics unsatisﬁable values variables veriﬁcation