High Voltage Electron Microscopy: Proceedings of the Third International Conference
Peter Roland Swann, Colin John Humphreys, M. J. Goringe
Academic Press, 1974 - Electron microscope, High voltage - 475 pages
What people are saying - Write a review
We haven't found any reviews in the usual places.
accelerating voltage alloy aluminium annealed atoms austenite axis bainite Bloch waves boundary Bragg Bragg reflection bright-field Burgers vector cavities cell cent chromatic aberration Congress on Electron contrast critical voltage crystal curve dark-field images defects deformation diameter diffraction pattern diffusion dislocation loops edge dislocations effect electron beam energy experimental exposure fault fibre flux formation fringe grain haematite high voltage high voltage electron increase inelastic scattering intensity interface interstitial irradiation lattice magnetite martensite materials matrix measured mechanism metals method MeV electron micrograph Microsc microscope nucleation objective lens observed obtained olivine optical orientation oxide particles Phil Phys plane precipitates Proc radiation damage reduced reflection regions resolution room temperature screw dislocations shown in Fig shows slip spherical aberration stage stereo strain stress structure surface thermal thin foils tilt tion transmission electron microscopy vacancy voltage electron microscopy weak-beam