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Development and Applications
The Identification and Characterization of Polymer Contaminants
Polymer Composite Failure Analysis by Infrared Reflectance
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30 micrometer 700 WAVENUMBERS absorbance absorption Airy disk analysis Analytical application of infrared band beam condensers capillary carbon Cassegrainian cell cellulose characterization chemical Chemistry cm1 resolution contaminants crystal deposited diameter dichroic dichroic ratio dichroic spectra Difference spectrum diffraction Digilab disk East Fishkill energy EXPERIMENTAL fiber Figure 11 Figure 9 film FT-IR microsampling FT-IR microscope functional group image Hopewell Junction identified infrared microscope infrared microspectroscopy infrared radiation infrared spectra infrared spectroscopy instrument IR-plan microscope kaolin Krishnan lignin manufacturing material MCT detector metal micro micrometers microsampling accessory microsampling technique microtomed numerical aperture observed obtained P. R. Griffiths paper particles phase polarized polyethylene polyimide polymer polymorphic polypropylene polyurethane problem Raman Raman spectroscopy Redundant Aperturing reflectance region result sampling area scans Semiconductor shown in Figure shows silicon wafer solvent specimen spectra were recorded Spectra-Tech spectrophotometer substrate subtracted temperature thickness Timken transformation transmission tube W. H. McFadden WAVENUMBERS WAVENUMBERS CM-1