Ion-solid Interactions: Permuted title index

Front Cover
INSPEC, Institution of Electrical Engineers, 1980 - Language Arts & Disciplines
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Contents

UBE ON BOMBARDMENT WITH PARENT AND FRAGMENT IONS
30
C INTERDIFFUSION OF METAL LAYERS WITH SILICON
34
GY STRAGGLING OF MEV 4HE 12C 14N AND 160 IONS
40
RVATION OF INSULATING MATERIALS WITH ION MICROPROBE
46
133 AND AR41 IONS OF KILOELECTRON VOLT ENERGIES
47
N CAS THEORY OF SPUTTERING I SPUTTERING YIELD
57
G HOMOGENEITY
75
MEV HE ON GERM SCATTERING OF 2 MEV HE
81
ERENT MASS IONS IMPLANTED INTO SILICON ANNEALING AMORPHOUS
145
ETER ION NODUS A SENSITIVE NEW INSTRUMENT
149
ANALYSIS OF LI RANGEENERGY DATA FOR KEV IONS IN AMORPHOUS
154
ILMS ELECTR ELECTRICAL CONDUCTION IN S I I M P I ANT E D AMORPHOUS
180
ALUMINUM SURFACE EXCITATION
194
LICON CARBIDE EFFECTS OF ANNEALING ON PROFILES OF ALUMINUM IMPLANTED IN SILICON CARBIDE AL IN SI 7 2 207551
277
N OF CHEMICAL SPUTTERING OF ORGANICS AND C BY TRACE
319
ATE CHARACTERISTICS OF THE GATED INTEGRATOR NUCLEAR
340

E HE IN GALLIUM AR SEN IDE Z N DEFECTS CHANNELING
94
DIATION 300 KEV NE IN GALLIUM PHOSPHIDE DEFECTS
103
PTH IN THE SEM ELECTRON CHANNELING ENERGY LOSS AMORPHOUS
109
R ALLOY STUDIED BY THE CHANNELING TECHNIQUE CU
110
SILICON HEAVILY IMPLANTED WITH AR AR IN SILICON AMORPHOUS
119
AL203 FILM ON 304 STAINLESS STEEL IONPLATE
125
CONSTRUCTION OF DOUBLE FOCUSING MASS SPECTROMETER
129
IN CONCENTRATION VOIDS THE OPTICAL ABSORPTION
134
IONIMPLANTED SURFACE ALLOYS IN COPPER
143
ETECTORS
373
NALYSIS
384
S IN ELEMENTAL IMAGING WITH AN ION MICROPROBE MASS
390
LER INSTALLATION OF A PREINJECTI ON ION SOURCEZM
404
SURFACE ANALYSIS
564
ANGLE
565
ANALYSER SYSTEM ON THE 5 5 MV VAN DE GRAAFF ACCE
575
ANGLE i
581
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