ISTFA 2011: Conference Proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA

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ASM International, 2011 - Electronic apparatus and appliances - 456 pages
 

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Contents

IPFA 2011 Best Paper
1
Emerging FA Techniques and Concepts
5
Circuit Edit
31
Packaging and Assembly Level FA I
60
Test and Diagnostics
86
Defect Characterization and Metrology
112
Photon Based Fault Isolation Techniques
146
FA Process and Case Studies I
176
Sample Preparation and Device Deprocessing I
242
Nanoprobing and Electrical Characterization I
269
Sample Preparation and Device Deprocessing II
296
Nanoprobing and Electrical Characterization II
316
Alternative Energy
330
FA Process and Case Studies II
345
Posters
367
Manuscript from 2010 Conference
446

Finding the Invisible Defect
189
MEMS Discretes and Optoelectronics Device FA
223
Counterfeit Microelectronics Detection and Mitigation
234

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