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Protection of semiconductor
The methodological and algorithmical basis for
A system for automated designing elements
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A/D converter accuracy ACTA IMEKO 1979 algorithm amplitude analog analysis application assembly automatic automation Baseband blast furnace calculated calibration CCS IP cells channel characteristics circuit coefficient components constant correlation cross-correlation density determined deviation device diagram electrical electronic equipment error estimation evaluation Figure flow flowmeter frequency function gauge hardware hobbing machine industrial input instruments Josephson effect Keywords laboratory laser load machine magnetic magnetometer maximum means measuring instruments measuring system mechanical memory ment meter method metrological microprocessor modules monitoring obtained operation optical output parameters particle performed phase locked loop photocathode possible pressure printed circuit board problems procedure processor production pulse range realized sample sensors sequence shown signal solution speed standard strain gauge structure technique temperature thermocouple tion transducer tube unit variables velocity voltage