Monte Carlo Modeling for Electron Microscopy and Microanalysis

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Oxford University Press, Apr 13, 1995 - Computers - 224 pages
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This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope, including backscattering, secondary electron production, EBIC and cathodo-luminescence imaging, and X-ray microanalysis. The computer code is given in a fully annotated format so that it may be readily modified for specific problems. Throughout, the author includes numerous examples of how such applications can be used. Students and professionals using electron microscopes will want to read this important addition to the literature.
 

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Contents

1 An Introduction to Monte Carlo Methods
3
2 Constructing a Simulation
9
3 The Single Scattering Model
25
4 The Plural Scattering Model
56
5 The Practical Application of Monte Carlo Models
77
6 Backscattered Electrons
81
7 Charge Collection Microscopy and Cathodoluminescence
114
8 Secondary Electrons and Imaging
134
9 Xray Production and Microanalysis
174
10 What Next in Monte Carlo Simulations?
199
References
207
Index
213
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