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the Variance Theorem
14 other sections not shown
applied average bandwidth bolometer calculation capacitance capacitive bolometer capacitor carrier cathode Chapter charge circuit of Fig conductance constant d.c. current dark current defined detected device dielectric diode discuss dynode effect emitted emitter energy equation equivalent circuit equivalent noise evaluate factor flicker noise fluctuation Fourier full-shot noise function galvanometer gate generation-recombination noise Hence high frequencies hole-electron pairs holes incident independent input JFET Josephson junction load resistance RL low frequencies low-frequency material measured modulated MOSFET multiplied noise figure noise resistance noise sources obtained output phase-sensitive detector photocathode photoconductor photodiode photoelectrons photons photovoltaic cell produced pyroelectric detector quantum radiation random variable recombination resistor saturation secondary emission Section semiconductor short-circuited shot noise shown in Fig signal-to-noise silicon space-charge region spectral intensity surface Sv(f Sx(f target technical sensitivity temperature term thermal noise transistor trap variance theorem varn vidicon wavelength yields zero Ziel