Optical Methods of Measurement: Wholefield Techniques

Front Cover
CRC Press, May 28, 1999 - Technology & Engineering - 328 pages
0 Reviews
Provides an examination of up-to-date optical measurement techniques employing laser, holographic and digital technology. The text analyzes the most advanced non-invasive methods for measuring stationary or mobile objects and surfaces. It provides information on practical and theoretical issues of reproducing extremely fine spatial resolution in two and three dimensions.
 

What people are saying - Write a review

We haven't found any reviews in the usual places.

Contents

Waves
1
Diffraction
17
Optical Filtering
25
Optical Components in Optical Metrology
26
Bibliography
32
Phase Evaluation Methods
33
Interference Equation
34
Fringe Skeletonization
35
Speckle Interferometry
148
The Correlation Coefficient in Speckle Interferometry
152
OutofPlane Speckle Interferometer
154
Duffys Method
156
Filtering
158
OutofPlane Displacement Measurement
161
Simultaneous Measurement of OutofPlane and InPlane Displacement Components
163
Other Possibilities for Aperturing the Lens
164

Temporal Heterodyning
36
QuasiHeterodyning
37
The PhaseShifting Method
38
PhaseShifting with Unknown But Constant Phase Step
40
Spatial Phase Shifting
43
The Fourier Transform Method
46
Spatial Heterodyning
47
Bibliography
49
Detectors and Recording Materials
50
Detectors
52
Image Detectors
61
Recording Materials
64
Bibliography
76
Holographic Interferometry
77
Hologram Recording
78
Reconstruction
80
Choice of Angle of Reference Wave
82
Types of Holograms
83
Experimental Arrangement
84
Holographic Recording Materials
87
Fringe Formation and Measurement of Displacement Vector
89
Loading of the Object
92
Measurement of Very Small Vibration Amplitudes
100
Stroboscopic IlluminationStroboscopic HI
103
Special Techniques in Holographic Interferometry
104
Heterodyne HI
113
Holographic Contouring Shape Measurement
116
Holographic Photoelasticity
120
Digital Holographic Interferometry
123
Bibliography
125
Speckle Metrology
127
Average Speckle Size
128
Superposition of Speckle Patterns
130
Speckle Pattern and Object Surface Characteristics
131
Speckle Photography
135
Methods of Evaluation
140
InPlane Vibration
144
Sensitivity of Speckle Photography
145
Particle Image Velocimetry
146
Shape Measurement Contouring
165
Speckle Shear Interferometry
166
Methods of Shearing
167
Theory of Speckle Shear Interferometry
170
Fringe Formation
171
Shear Interferometry Without the Influence of InPlane Component
172
Electronic Speckle Pattern Interferometry ESPI
174
Contouring in ESPI
179
Use of Retroreflective Paint
180
Spatial Phase Shifting
181
Bibliography
182
Photoelasticity
183
Superposition of Two PlanePolarized Waves
184
Linear Polarization
185
HI Circular Polarization
186
Production of Polarized Light
187
Malus Law
192
The StrainOptic Law
195
Evaluation Procedure
203
Measurement of Fractional Fringe Order
205
Phase Shifting
208
Reflection Polariscope
211
Holophotoelasticity
213
ThreeDimensional Photoelasticity
220
Examination of the Stressed Model in Scattered Light
222
Bibliography
226
The Moire Phenomenon
227
The Moire Fringe Pattern Between a Linear Grating and a Circular Grating
231
Moire Between Sinusoidal Gratings
232
Moire Between Reference and Deformed Gratings
235
Moire Pattern with Deformed Sinusoidal Grating
237
Contrast Improvement of the Additive Moire Pattern
240
Slope Determination for Dynamic Events
264
Curvature Determination for Dynamic Events
266
The Talbot Phenomenon
270
Bibliography
273
Additional Reading
275
Index
317
Copyright

Common terms and phrases

References to this book

All Book Search results »

Bibliographic information