Optical test and measurement technology and equipment: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies : 2-5 November, 2005, Xian, China, Volume 1

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SPIE, 2006 - Technology & Engineering - 1132 pages
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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

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Contents

Part
Coma aberration measurement by lateral Image displacements at different defocus
Optical parameters analysis of a semiconductive film based on genetic algorithm
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