Optical test and measurement technology and equipment: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies : 2-5 November, 2005, Xian, China, Volume 1
SPIE, 2006 - Technology & Engineering - 1132 pages
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
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Coma aberration measurement by lateral Image displacements at different defocus
Optical parameters analysis of a semiconductive film based on genetic algorithm
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2nd International Symp accuracy algorithm analysis angle aperture applied aspheric axis beam Beijing calculated camera China coefficient components confocal CPLD detection detector digital holography distribution electronic equation error Figure filter fluorescence Fourier transform frequency function grating image processing infrared Institute of Optics intensity interferogram interferometer J. C. Wyant knife-edge laser lens light source linear Mach-Zehnder interferometer measurement system Measurement Tech method microscope mirror modulation noise object obtained optical cavity optical fiber Optical Manufac optical microcavity Optical Test output parameters phase shifting photon pixel plane plasma plate polarization polynomials precision probe Proc Raman scattering range reflectivity refractive index resolution sample scattering sensitivity shown signal spatial spectral spectrum SPIE Vol surface target technique Technology China temperature Test and Measurement Testing Tech Univ voltage Wang wave wavefront wavelength width Xi'an Yuan Zernike polynomials Zhang