Probability and its Applications for Engineers

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CRC Press, Jun 26, 1992 - Technology & Engineering - 664 pages
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Demonstrating that probability is an applied science useful to engineers and covering, in two parts, all of the material that most engineers will encounter in practice, self-study or graduate study, this book offers a thorough development of probability theory and shows how the theory can be adapted to solve practical problems.;Part 1 of Probability and its Applications for Engineers explicates the theory and illustrates its use with concrete examples from such topics as quality control/acceptance sampling, telephone network blocking, economics and inventory control, the use of moments, and the overly conscientious worker phenomenon.;Developing basic results to a high degree, and comprehensively enough to cope with real engineering tasks, Part II elaborates on practical applications of the theory in areas of interest to practising engineers. Beginning with an introduction to statistics, Part II provides concise, self-contained examinations of control charts, tolerancing, reliability, random processes and decision trees.;With end-of-chapter problem sets and answers, a bibliography and over 1100 display equations, Probability and its Applications for Engineers sets out to provide a resource for quality and reliability, mechanical, and electrical and electronics engineers, and upper-level undergraduate, graduate and continuing-education students in these disciplines.
 

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Contents

ELECTRON AN0 ION OPTICS AN0 OPTICAL SYSTEMS
3
l0 Ohservations of Surfaces Using Microprohe Reflection High
6
ELECTRON EMI55ION AN0 EMI55ION AN0 IONIZATION MICRO5COPY
35
ELECTRON AN0 ION PRO8E MICROANALYSIS
207
ELECTRON AN0 ION MICROSCOPY OF SURFACES
257
ELECTRON 0IFFRACTION
363
TRANSMISSION ELECTRON MICROSCOPY
475
l0 Applications of Transmission Electron Microscopy and Related
607
Introduction
685
0etermination of Crystallographic Orientations
694
SPECIMEN PREPARATION
719
COMPUTER PROGRAMS FOR ELECTRON 0IFFRACTION ANALYSIS
755
TA8ULATE0 MATERIALS CONSTANTS AN0 USEFUL PHYSICAL PROPERTIES
775
E PRO8LEM SOLUTIONS AN0 0ISCUSSION
789
F COURSE OUTLINES
813
Copyright

HIGHVOLTAGE ELECTRON MICROSCOPY
649

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Page ii - University of Rochester Rochester, New York 1. Electron and Ion Microscopy and Microanalysis: Principles and Applications, Lawrence E. Murr 2. Acousto-Optic Signal Processing: Theory and Implementation, edited by Norman J. Berg and John N. Lee 3. Electro-Optic and Acousto-Optic Scanning and Deflection, Milton Gottlieb, Clive LM Ireland, and John Martin Ley 4.

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