Proceedings: Eighth National Symposium on Reliability & Quality Control, Washington, D.C., January 9-10-11, 1962 |
Common terms and phrases
acceptance analysis application areas basic Beta distribution bility binomial distribution capacitors characteristics Chart circuit complete component computed considered contractor curve defined determine device dimensions Diode effect electrical Electron environment Equation equipment estimate evaluation example expected exponential exponential distribution factors fail failure rate failure reporting fraction defective function hazard rate hr hr human error inspection laboratory limits maintenance manufacturing Martin Company mathematical measure ment method missile MTBF normal normal distribution NUMBER OF LOTS number of tests obtained operation parameter performance personnel phase Poisson Poisson distribution Potentiometer probability problem procedure Quality Control redundant reliabil Reliability Engineering reliability program reliability testing resistors sample size sampling plan selected space specification statistical stopping production stress Switch system reliability Table techniques temperature test plans tion total number transistor tz(t units vacuum variables variance variation voltage Weibull distribution