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Life Test Requirements in Military Transistor Specifications W H VonAlven
Systematic Approach to Transistorized Equipment Design O Golubjatnikov
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acceleration acceptance analysis application ARINC assumed assurance average basic bility capacitor characteristics chi-square test circuit complete considered cost curve defective degree design of experiment determine deviation distribution effectiveness electrical electronic equipment environment environmental equation estimate evaluation example exponential exponential distribution factors failure rate field Figure frequency given improvement indicated inspection interval laboratory log-normal distribution maintenance major component manufacturing mathematical mean measure ment method missile MTBF normal normal distribution number of failures obtained operation output paper parameters period phase Poisson distribution prediction present probability problem procedure quality control radar ratio RCA Service Company relia reliabil reliability engineers reliability program repair replacement Research resistors sampling plan shown spares specification standard statistical stress system performance Table techniques temperature test equipment tion transistor tubes unit vacuum tube valves variable voltage weighting function