Proceedings, Second National Symposium on Quality Control and Reliability in Electronics: Washington, D.C., January 9-10, 1956 |
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Contents
Opening by I Walter Greer | 2 |
Moderated by Dr Robert D Huntoon | 18 |
SESSION III | 46 |
Copyright | |
5 other sections not shown
Common terms and phrases
acceptance actual addition analysis application Application Severity approach associated automatic average basis become calculated capacitors cards cause characteristics chart circuit combination complete component considerable considered continued corrective cost curve defective dependent determine distribution economic effect effort Electric electronic engineering environment environmental equipment error established estimated evaluation example existing factor failed failure rate field Figure force function important improve included increase inspection laboratory less limits maintenance major manufacturing material mean measure ment method missile noted obtained operation percent performance period Phase position possible practical prediction present probability problem procedures production punched quality control received reduced relation reliability reports Research resistors sample shown shows specifications standard statistical Step subsystem successful Table tion tubes units values voltage