Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

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IEEE Computer Society Press, Aug 1, 1994 - Computers - 141 pages
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Contents

A SelfDiagnostic BIST Memory Design Scheme
7
An OnChip Test Scheme for SRAMs
16
Mechanical StressInduced Void Formation in Thin Films
22
Copyright

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