Scientific Charge-coupled DevicesThe charge-coupled device (CCD) has recently celebrated its 30th birthday. The remarkable invention of Boyle and Smith of Bell Labs has dramatically changed the course of imaging in disciplines ranging from astronomy to biotechnology. James R. Janesick, an early proponent of the Scientific CCD, presents a careful and comprehensive history, tutorial and state-of-the-art description of the CCD. The book provides valuable reference information to scientists, engineers and hardware managers involved with imaging CCDs and high-performance camera systems, as well as those who need a comprehensive introduction to the subject. ""Charge-Coupled Devices"" is both a history of this development and a comprehensive reference manual on CCD and camera design, fabrication, operation, characterization and optimization. The key processes of CCD operation - charge collection, charge transfer and charge measurement - are described physically and illustrated by experimental data. Standards for characterizing and optimizing CCDs are presented in detail and the ultimate physical limitations on performance parameters discussed. Worked examples throughout provide valuable tutorials, and give the reader an appreciation for the level of performance that is being achieved by today's CCDs. |
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Excellent book for anyone associated with CCD sensors. The chapter on the photon transfer process is especially useful for characterization. Good examples and easy to follow.
Contents
History Operation Performance Design Fabrication and Theory | 3 |
CCD Transfer Curves and Optimization | 95 |
References | 125 |
References | 268 |
Charge Collection | 273 |
Charge Transfer | 387 |
Charge Measurement | 490 |
Noise Sources | 605 |
Damage | 721 |
| 841 | |
Appendixes | 847 |
Glossary of CCD Terms | 871 |
| 899 | |
Common terms and phrases
applied approximately array Assume backside barrier bias camera capacitance caused channel Chapter characteristics charge clock collecting column constant damage dark current dark spikes depletion depth Determine device diffusion discussed doping drain edge effect electric field electrons energy equation example exhibit Figure frequency function gain gate given greater ground holes horizontal register important increases interaction interface inverted layer light loss material measured MOSFET noise Note occurs operating temperature oxide particle performance phase pixel plots poly potential presents problem produced proton radiation range rays read noise reduced refer region reset response seen sensitivity sensor shield shown in Fig shows signal silicon Solution stop substrate surface taken technique thickness thinned transfer transfer curve traps vertical voltage wavelength x-ray yield
Popular passages
Page 841 - Effects of space radiation damage and temperature on CCD noise for the Lyman FUSE mission, Photonics for Space Environments (E.
References to this book
Bibliographic information
| Title | Scientific Charge-coupled Devices Volume 83 of Press Monograph Series Volume 83 of SPIE monograph Spie Series |
| Author | James R. Janesick |
| Edition | illustrated |
| Publisher | SPIE Press, 2001 |
| ISBN | 0819436984, 9780819436986 |
| Length | 906 pages |
| Subjects | › › Technology & Engineering / Electronics / Semiconductors |
| Export Citation | BiBTeX EndNote RefMan |