Smart focal plane arrays and focal plane array testing: 17-18 April 1995, Orlando, Florida
SPIE, 1995 - Technology & Engineering - 348 pages
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Nonuniformity correction of infrared imaging arrays by analog techniques 247402
Digital characterization of a neuromorphic IRFPA 247403
30 other sections not shown
1/f noise A/D conversion AEDC algorithm analog aperture background bandwidth bias blackbody temperature bolometer calculated calibration camera chamber channel characterization chip circuit clock CMOS coefficient components cost crosstalk crosstalk measurement cryoprobe detector array developed device digital signal processor diode DRES DWSG dynamic range electronics emissivity equation evaluation filter focal plane arrays FPATC FPCC frame frequency function gain and offset hardware HgCdTe implemented infrared detectors infrared focal plane input integration interface IRFPA laser linear measurements microns mission simulation modulator multiplexer Neuromorphic offset correction on-chip operation optical output parameters PCTGEN performance photon pixel preamplifier processor pulse pyroelectric radiation radiometric readout reduced sample scan sensor shown in Figure signal conditioning signal processing spatial noise spectral response SPIE Vol staring array target TDWSG technique temporal test station thermal throughput values voltage Wave Process wave-sum plane wavelength