Specification and measurement of optical systems: 14-16 September 1992, Berlin, FRG
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Generation of lens designs for optimization 178003
Optics in hostile environments 178101
Design of optical interference coatings 1992 178201
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accuracy algorithm angle annular aperture applications array aspheric axis beam beam parameter product BRDF calculated calibration camera coating coefficients components coordinates curvature defects defined density detector deviation diameter diffraction distribution error evaluation factor field Figure focal length fringe Gaussian beam geometrical global optimization holograms indication intensity interferogram interferometer laser lens design lenses magneto-optical maximum measurement merit function method mirror modulation noise object optical surfaces optical system optical transfer function parameters performance phase photoresist pixel plane point spread function polynomials problems pupil radius reference refractive index rotation sample scanning scattering scratches sensor Shack-Hartmann signal slit solutions spatial frequency specification spherical spherical aberration SPIE spread function standard substrate symmetry technique telescope temperature thermal tilt tolerances Twyman-Green interferometer values wave aberration wavefront aberration wavefront sensor wavelength width X-ray XRII tube Zernike