Statistical process control in industry: implementation and assurance of SPC
During the past decade interest in quality management has greatly increased. One of the central elements of Total Quality Management is Statistical Process Control, more commonly known as SPC. This book describes the pitfalls and traps which businesses encounter when implementing and assuring SPC. Illustrations are given from practical experience in various companies. The following subjects are discussed: implementation of SPC, activity plan for achieving statistically controlled processes, statistical tools, and lastly, consolidation and improvement of the results. Also, an extensive checklist is provided with which a business can determine to what extent it has succeeded in the actual application of SPC. Audience: This volume is written for companies which are going to implement SPC, or which need a new impetus in order to get SPC properly off the ground. It will be of interest in particular to researchers whose work involves statistics and probability, production, operation and manufacturing management, industrial organisation and mathematical and quantitative methods. It will also appeal to specialists in engineering and management, for example in the electronic industry, discrete parts industry, process industry, automotive and aircraft industry and food industry.
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SPC as Part of Quality Policy
Implementation Plan for SPC
Facilitating Suitable Conditions
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achieved activity plan analysis application approach ASM Lithography assignment bad product basis batch cause and effect certificate Chapter common cause variation control action plan control chart limits control limits control loop control situations Deming diameter diodes employees estimator evaluated example executive management factors Figure furnace Hengelo implementation of SPC implementing SPC important Improvement Team indicated individual measurements machine measurement variation methods monitored necessary OCAP operations management organization p-chart parameters PDCA phase Philips Semiconductors possible pre-control Printed Circuit Boards problems Process Action Team process capability process capability index process control process engineer process step quality management random variation requirements risk run length sample means Shewhart Shewhart type signal SPC implementation SPC point SPC Steering Committee special causes specification limits Stadskanaal statistical Statistical Process Control suppliers Table variance variation owed Veldhoven wafer