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Preparation of Materials
An Evaluation of Melt Techniques for the Orientation
6 other sections not shown
annealing Appl applications binding energy bolometer BSCCO buffer layer bulk c-axis chemical coherence length composition compounds cooling critical current density decrease devices dielectric effect electron epitaxial equation etching fabrication film deposited flux flux pinning frequency glass glass-ceramics grain boundaries growth heating high Tc superconductors high temperature superconductors high-Tc HTS materials IEEE Trans increase interface ions Josephson junctions lattice Lett liquid magnetic field measured metal microwave MOCVD noise normal o-YBCO observed obtained oriented oxide oxygen parameters partial patterned peak penetration depth peritectic perovskites phase Phys Physica pinning plane polycrystalline region resonator samples sapphire shown in figure shows silicon single crystals spectra sputtering structure studies substitution substrate superconducting superconducting films surface impedance surface resistance technique temperature dependence textured thermal thickness thin films TICaBaCuO Tl-based transition valence X-ray diffraction YBaCuO film YBCO YBCO films YBCO thin films