Taguchi techniques for image and pattern developing technology
This is the first book on the Taguchi method designed specifically to help engineers working in the field of imaging and patterning science and technology to get up to speed with the Method quickly and easily. Using an abundance of case-study examples, the book outlines Taguchi's quality management steps. Features the latest of Taguchi's ideas which were developed in 1988-1992--e.g., the SN Ratio.
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THE LATEST IMAGE DEVELOPMENT TECHNOLOGY
IMAGE DEVELOPMENT AND THE LATEST IMAGE
DYNAMIC CHARACTERISTICS AND QUALITY PROBLEMS
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2-level 3-level factors adjustment ANOVA calculated as follows chart is prepared coefficient compound noise factor condition is selected conducted confirmation test copiers cream solder current condition defect derived difference dimension dynamic characteristics electric circuit electrophotography energy engineer evaluation example EXPERIMENTAL DATA factorial effect chart film thickness Genichi Taguchi harmful component heat high SN ratios ideal relationship image density image development imaging area improvement input input/output integrated circuits interaction level average level combination level sum line width liquid-crystal logit number of experiments operating window optimal condition candidate orthogonal array outer array output photosensitive material primary colors printer printing plate printing process plate proportional equation quality characteristics quality problems quantity ratio and sensitivity ratio for dynamic robustness sample screen printing process sensitivity are calculated signal factor signal-factor level speed surface Taguchi method temperature toner total sum vacuum film variability viscosity voltage zero