Tests, measurements, and characterization of electro-optic devices and systems: 8 September 1989, Boston, Massachusetts
SPIE, 1990 - Technology & Engineering - 196 pages
What people are saying - Write a review
We haven't found any reviews in the usual places.
accuracy algorithm attenuation automated backscatter backscatter signature cable plant calculated calibration characterization chromatic dispersion connector core coupler coupling ratio CR bound curve cut-back decay rate defects definitions of MFR density dependence detector devices differential scattering domain effect electro-optic Electron equation estimates evaluation experimental fault FDDI fiber loss fiber optic fiber segment fibre field distribution frequency Gaussian Hankel transform heat transfer coefficient increased insertion loss integrating sphere interface laser diode launch fiber length loss measurement MANDREL mandrel wrap marker settings meters modulation monitoring noise OFBSG operating optical fiber optical power OTDR OTDR's output parameters performance Petermann photodiode picoseconds plotted power penalty pulse reflection points RMS width sample scanning aperture self-pulsating shown in Figure signal Single-Mode SMA Connector SNR dB spectral splicing standard streak camera techniques temperature test method TEST SETS test source transmitter variance waveguide wavelength