Electron Microscopy, Volume 1San Francisco Press, 1978 - Electron microscopes |
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Common terms and phrases
aberration alloy amorphous analysis angle annealing aperture atoms axis Bloch wave Burgers vector calculated carbon clusters corresponding CTEM damage dark field defect defocus deformation density detector determined diameter diffraction pattern diffusion dislocation loops distribution domain domain wall effect electron beam electron diffraction electron microscopy energy loss experimental field image Figure film fringes function grain boundary high resolution holography increased intensity interface interstitial investigated irradiation lattice images layer magnetic martensite material matrix measured metal method micrographs microscope nucleation objective lens observed obtained optical Optik orientation oxide p-n junction parameters particles Phil Phys plane precipitate probe Proc region sample scanning electron microscope scattering shown in Fig shows silicon single crystal spatial specimen spherical aberration spots STEM structure substrate surface technique temperature thickness tilt tion transmission electron transmission electron microscopy twin vacuum voltage X-ray zone