Advances in Imaging and Electron Physics, Volume 118
Academic Press, Sep 25, 2001 - Technology & Engineering - 281 pages
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Chapter 3 Recent Developments of Probes for Scanning Probe Microscopy
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