Advances in Imaging and Electron Physics, Volume 118
Academic Press, Sep 25, 2001 - Technology & Engineering - 281 pages
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Chapter 2 Noninterferometric Phase Determination
Chapter 3 Recent Developments of Probes for Scanning Probe Microscopy
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algorithm aperture tip Appl applied approach atomic force microscopy biological tissue Bloch equations bound spins cantilever probes carbon nanotubes coherent contrast points density deŞned deŞnition diamond effect efŞciency electron energy etching exchange fabrication function GaAs geodesic gradient gradient-intensity criterion gray-level Gureyev histogram holography idempotent image in Figure inßuence intensity lesions Lett longitudinal magnetization magnetic resonance magnetic Şeld mathematical morphology modiŞed multiple sclerosis near-Şeld optical microscopy near-Şeld probe Nugent observed obtained Oesterschulze offset frequency original image output image Paganin parameters phase retrieval Phys pixels plane properties proton pulse quadtree quantitative regions relaxation resonance frequency reßection sample scanning near-Şeld optical scanning probe microscopy scanning tunneling microscopy Schottky diode sequential MSF shown in Figure signal silicon dioxide solution spatial spin pool ßat zone surface technique tissue transformation VCSEL vector waveguide X-ray Z-spectrum Şlm Şltered image Şlters Şrst