Measurement for Progress in Science and Technology: Acta IMEKO 1979 : Proceedings of the 8th IMEKO Congress of the International Measurement Confederation Held from the 21st to the 27th May 1979, Moscow, USSR, Volume 1 |
Contents
The influence of microprocessor technology on instrument and system | 3 |
Principles of computerized measuring | 19 |
Application of electrooptical techniques in metrology | 27 |
Copyright | |
31 other sections not shown
Common terms and phrases
accuracy ACTA IMEKO 1979 algorithm amplitude analysis application autocorrelation calculation calibration Cepstrum characteristics chemical circuit coefficients coldworking components confidence interval coordinates correlation corresponding determined diagram digital filter distribution dynamic errors electronic elements equation estimation example Figure frequency fringe pattern function given grating input signal interface Keywords laser length linear magnetic mean square error means measurable properties measurement theory measuring computing complex measuring device measuring instruments measuring system ment method metrological microcomputer microprocessors minicomputer modulation moiré nonlinear obtained operation optical optimal output signal parameters phase photodetector possible problem procedure process analyser processor Prof quantity quantizer random range realized relation resonant wire retroreflectors sampling scanning sensor shown spectral spectrum speed standard statistical step responses strain gauges structure surface surface plates technique theoretical tion transducer UMKM uncertainty voltage