Electron Microscopy: Proceedings of the ... International Congress on Electron Microscopy, Volumes 2-3Les Editions de physique, 1998 - Electron microscopy |
Contents
Observation of functional details on membrane proteins through an electron beam | 3 |
Scanning probe microscopies and nanotechnology | 11 |
IFSEM SYMPOSIUM | 17 |
17 other sections not shown
Other editions - View all
Common terms and phrases
aberration correction accelerating voltage alloy amplitude analysis angle astigmatism atoms beam tilt calculated carbon cell column contrast corrector Cryo-electron microscopy crystal defocus density detection detector diffraction dislocation dopant Dyck edge EELS EFTEM electron beam electron crystallography electron energy electron holography elements ELNES energy filter energy loss energy resolution exit wave experimental field emission Figure Fourier function high resolution HREM HRTEM instrument intensity interface Japan lattice layer maps Materials Science measured method Microanalysis micrographs Microsc monochromator objective lens observed obtained operation optical parameters particles phase image Phys pixel plane probe Proc processing protein quantitative reconstruction ribosome sample scanning electron scanning electron microscope scattering secondary electron semiconductor shown shows signal simulation spatial resolution specimen spectra spectroscopy spectrum spherical aberration structure supercell surface technique thickness thin tilt tomography transmission electron microscopy Ultramicroscopy University Wien filter X-ray