INT CON on Electron Microscopy, Materials Science, Volume 3 |
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Contents
Observation of functional details on membrane proteins through an electron beam | 3 |
Electron microscopy of new materials John Mathews Memorial Lecture | 9 |
searching for order in a complex virus | 15 |
15 other sections not shown
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Common terms and phrases
aberration correction accelerating voltage alloy amplitude analysis angle astigmatism atomic beam tilt Boersch calculated carbon cell column contrast corrector Cryo-electron microscopy crystal defocus density detection detector diffraction dopant Dyck edge EELS EFTEM electron beam electron crystallography electron energy electron holography elements ELNES energy filter energy loss energy resolution exit wave experimental field emission Figure function Germany high resolution HREM HRTEM instrument intensity interface Japan lattice layer Materials Science measured method Microanalysis micrographs Microsc monochromator objective lens observed obtained operation optical parameters particles phase image Phys pixel plane potential probe Proc processing protein quantitative reconstruction References ribosome sample scanning electron scanning electron microscope scattering secondary electron semiconductor shows signal silicon silicon drift detector simulated spatial resolution specimen spectra spectroscopy spectrum spherical aberration structure surface technique Technology thickness thin tilt tomography transmission electron microscopy Ultramicroscopy University X-ray