Automated Inspection and High Speed Vision Architectures: 3-4 November 1987, Cambridge, MassachusettsMichael J. W. Chen, Rolf-Jürgen Ahlers SPIE--the International Society for Optical Engineering, 1988 - Technology & Engineering - 274 pages |
Common terms and phrases
algorithm analysis applications architecture array attention scheme automated binary binary image blackboard Blackboard Systems blob breakpoints calculated calibration camera color Computer Vision configuration coordinate defined described detection developed digitizer distance distance transformation dynamic edge error extraction feature extraction filter flaw flying objects fractal frame function geometry grey level hardware high speed horizontal IEEE image processing implemented input inspection intensity kernel Kiwivision light linear machine vision mask matrix measurement memory MicroVax modules motion motion detection moving node noise operation optical orientation output parallel parameters pattern recognition performed phosphor photodetector pipeline pixel position probe problem Prolog real-time region robot sampling scan sensor fusion sensor resolution shadow-mask shift register shown in Figure signal simulation skeleton space spatial strobe surface target task techniques texture threshold tracking transform vision system visual VMEbus window