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THE OPERATION AND CALIBRATION OF THE ELECTRON MICROSCOPE
19 other sections not shown
alloys angle arising astigmatism atomic beam direction BF image boundary Bragg Bragg angle Burgers vector CDF images cementite centre Courtesy crystal defects crystal structure cubic described in section determined diameter diffracted beam diffracted spot diffraction pattern domain double diffraction effects elastic electron beam electron diffraction electron diffraction pattern electron microscope equation Ewald sphere example film foil surface Frank loops Gevers habit plane Hearmon incident beam indexed intensity interface interplanar spacings invisible Kikuchi line Landuyt magnification materials matrix Moire patterns objective aperture objective lens obtained occur operative reflection orientation relationship parallel particles perpendicular Phil Phys pole position precipitate produce reciprocal lattice reciprocal lattice points reciprocal space reflecting planes resolution rotation SADP satellites schematically shown in figure shows specimen tilt spot patterns stacking fault Stat stereogram strain field streaks symmetrical technique thin foil tilting the specimen twin values vanadium carbide visible zone axis