Electron Microscopy: Abstracts of Papers Presented to the ... International Congress on Electron Microscopy, Volume 1Australian Academy of Science, 1962 - Electron microscopy |
Contents
Investigations of Charged Particle Tracks in Solids | 1 |
The Prevention of Contamination without Beam Damage to the Specimen | 4 |
Walker R M and Price P | 6 |
Copyright | |
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alloy aluminum angle annealed aperture atoms austenite axis Bild bombardment Burgers vector cathode contrast copper crystallites dark field defects deformed density diameter dislocation loops effect electron beam electron diffraction electron gun electron micrograph electron microscope électronique electropolishing Elektronen energy evaporation Figure filament formation fracture grain boundary graphite grid growth heating inelastically scattered ions irradiation Laboratory lamellae lattice layer lens magnetic magnification martensite material metal micron mullite nickel normal nucleation objective objective lens observed obtained occurs orientation oxide parallel particles phase Phys plane platelets platinum precipitates Proc produced quenched regions sample Selected area diffraction shadowed shown in Fig shows single crystals slip solution specimen stacking fault stacking fault energy stage steel strain structure substrate surface tangles technique thermal thickness thin foils tilting tion transmission electron transmission electron microscopy tube tungsten twin vacancy vacuum voltage X-ray