Scanning Probe Microscopy of Soft Matter: Fundamentals and Practices

Vladimir V. Tsukruk, Srikanth Singamaneni

John Wiley & Sons, Jan 9, 2012 - Technology & Engineering - 661 pages

Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy,
showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide
range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning.

This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy
in soft matter research.

From the contents:

* Atomic Force Microscopy and Other Advanced Imaging Modes
* Probing of Mechanical, Thermal Chemical and Electrical Properties
* Amorphous, Poorly Ordered and Organized Polymeric Materials
* Langmuir-Blodgett and Layer-by-Layer Structures
* Multi-Component Polymer Systems and Fibers
* Colloids and Microcapsules
* Biomaterials and Biological Structures
* Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography
* Microcantilever-Based Sensors

Contents

• Scanning Probe Microscopy Basics: 9
• Basics of Atomic Force Microscopy Studies of Soft Matter: 35
• Advanced Imaging Modes: 69
• Part Two Probing Nanoscale Physical and Chemical Properties: 99
• Probing of Microthermal Properties: 153
• Chemical and Electrical Properties: 175
• Scanning Probe Optical Techniques: 199
• Part Three Scanning Probe Techniques for Various: 223
• Organized Polymeric Materials: 257
• 11: 280
• 12: 329
• 13: 364
• 14: 404
• LangmuirBlodgett and LayerbyLayer Structures: 417
• Colloids and Microcapsules: 459
• 16: 493
• Part Four Nanomanipulation Patterning and Sensing: 527
• 18: 547
• DipPen Nanolithography: 577
• Index: 623

About the author

Vladimir V. Tsukruk received his MS degree in physics from the National University of Ukraine, and his PhD and DSc in chemistry from the National Academy of Sciences of Ukraine. He carried out his post-doc at the universities of Marburg, Germany, and Akron, USA, and is currently
a professor at the School of Materials Science and Engineering, Georgia Institute of Technology. He was elected an APS Fellow in 2010 and an MRS Fellow in 2011. He serves on the editorial advisory boards of five professional journals and has co-authored around 300 refereed articles in archival journals, as well as five books. Professor Tsukruk's research in the fields of surfaces/ interfaces, molecular assembly, nano- and bioinspired materials has been recognized by the Humboldt Research Award and the NSF Special Creativity Award, among others.

Currently an assistant professor in the Department of Mechanical Engineering and Materials Science at Washington University in St. Louis, Srikanth Singamaneni received his MS degree in electrical engineering from Western Michigan University and his PhD in polymer materials
science and engineering from Georgia Institute of Technology. A recipient of the Materials Research Society Graduate Student Gold Award, he has co-authored over 60 refereed articles in archival journals as well as five book chapters. His current research interests include applications
of scanning probe microscopy in biology, physical/chemical sensors based on organic/inorganic hybrids and plasmonic biosensors for label-free and point of care diagnostics.

Bibliographic information

• Title: Scanning Probe Microscopy of Soft Matter: Fundamentals and Practices
• Authors: Vladimir V. Tsukruk, Srikanth Singamaneni
• Publisher: John Wiley & Sons, 2012
• ISBN: 3527639969, 9783527639960
• Length: 661 pages
• Subjects: Science / Chemistry / General; Technology & Engineering / Materials Science / General; Technology & Engineering / Mechanical