Reflection High-Energy Electron Diffraction

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Cambridge University Press, Dec 13, 2004 - Science - 353 pages
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Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth.
 

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Contents

Instrumentation
12
The diffraction conditions
28
Geometrical features of the pattern
43
Kinematic electron diffraction
130
Fourier components of the crystal potential
154
Dynamical theory transfer matrix method
161
Dynamical theory embedded Rmatrix method
173
Dynamical theory integral method
192
Inelastic scattering in a crystal
211
Weakly disordered surfaces
234
Strongly disordered surfaces
260
RHEED intensity oscillations
270
Appendix A Fourier representations
314
Appendix F Optimization of dynamical calculation
328
Index
350
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