The Future of Test: International Test Conference, 1985 Proceedings, November 19, 20, 21, 1985 |
Contents
Keynote Speaker | 3 |
TEST CONFERENCE | 10 |
Test Generation System Directions | 39 |
Copyright | |
41 other sections not shown
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Common terms and phrases
1985 International Test algorithm analysis applied Automatic Test Pattern Automation backtracking calibration cells chip circuit clock CMOS combinational cost cycle delay fault delay test detection device device under test diagnostics Digital equipment error example fanout fault coverage fault model fault simulation flip functional test gate delay GIPS hardware IEEE implementation instrument interface International Test Conference latch LFSR load logic logic value manufacturing measure memory method microprocessor node operation output Paper parameters PEAT performance port probability problem processor propagation random test reconvergent scan selected self-test sensitization sequence sequential sequential circuit shift register shown in Figure signal specific stuck-at faults Table techniques Teradyne test counts test length test pattern test program test system test vectors testability tester tion transistor transition VLSI voltage wafer watchdog XOR gate