The Future of Test: International Test Conference, 1985 Proceedings, November 19, 20, 21, 1985

Front Cover
IEEE Computer Society Press, 1985 - Integrated circuits - 988 pages

From inside the book

Contents

Keynote Speaker
3
TEST CONFERENCE
10
Test Generation System Directions
39
Copyright

41 other sections not shown

Other editions - View all

Common terms and phrases

Bibliographic information